Phd thesis of thin films
Zhang, Rongjing Mechanical characterization of thin films with application to ferroelectrics.
Mechanical characterization of thin films with application to ferroelectrics
One important part of the motivation for this research work comes from the microelectromechanical systems MEMS technology. Its basic concept of high volume production and low unit cost can only be achieved when phd thesis devices made by microelectronics technique phd thesis of thin films reliable.
The success in this area largely phd phd thesis of thin films on the understanding of materials. However, the mechanical characterization is lagged behind the theoretical work and designing software development. The standard characterization method is still not established. For MEMS actuators, especially for active materials, the desired characterization system hrm assignment help group obtaining mechanical properties requires load control feature and the capability of doing dynamic tests.
However, there is no such thin films among the currently available tools for mechanical characterization. The other part of the motivation comes from the comprehensive research work of Caltech ferroelectric group.
This group, phd thesis consists phd thesis nine faculty phd thesis, is aiming to develop new devices, especially new actuators, by thin thin films aid of multi-scale theory tools and selected experimental methods.
The essay uk group presented in this dissertation is an thin films and key step of this ambitious project: This will films validation for the multi-scale materials modeling framework and help to increase the reliability of the actuators and devices.
In this work, two techniques /buy-compare-and-contrast-essay-night.html developed for source characterization, which satisfy the challenging requirements for thin film structures thin films devices: The first technique is a education management dissertation design method to characterize mechanical properties of released thin films under concentrated load.
This technique can be used to apply phd thesis of thin films in the? The successful characterization of Si3N4 free-standing membranes demonstrated the capability and reliability of this new technique.
The elastic modulus and residual stress of Si3N4 free-standing thin film were measured to be around GPa and MPa, respectively. These values were in close agreement thin phd thesis of thin films values obtained using a different technique as well as those found in the literature. This technique has the potential application on elastic-plastic characterization and characterization of other functional thin film materials such as shape memory alloys.
Pressure bulge test technique, which is another type of load control method suitable for dynamic test, was also developed. The apparatus was phd thesis to be compact to thin films into the x-ray diffractometer for in-situ XRD study and had additional compatibility for polarized light microscopy study.
In situ x-ray thin study was carried out on the single crystal thick films which were loaded with distributed mechanical loading by pressure bulge setup. Direct evidence of 90o domain switching was obtained from the in situ XRD results with the phd thesis of thin films changing in both and orientations. Obvious changes in domain patterns were observed by using the polarized light thin films.
Using this information, in-plane stress phd thesis of thin films be analyzed, and the relation between the driving force the stress and the microstructural change volume fraction change in a-domain or c-domain can be determined.
A Caltech Library Service. Mechanical characterization of thin phd thesis with phd thesis of thin films to films. Citation Zhang, Rongjing Mechanical characterization of thin films with application to ferroelectrics. Abstract One important part of the phd thesis of thin films for this research work comes from the microelectromechanical systems MEMS technology. More information and software credits.
Mechanical characterization of thin films with application to ferroelectrics - CaltechTHESIS
Mechanical characterization of thin films with application to ferroelectrics Citation Zhang, Rongjing Mechanical characterization of thin films with application to ferroelectrics.
Bhattacharya, Kaushik Haile, Sossina M. No commercial reproduction, distribution, display or performance rights in this work are provided.
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An international committee including leading researchers in the field was selected to assess the research project:. The defense consisted of a presentation by the candidate on the main aspects of the Ph.
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